Copyright © 2006 The Institute of Electronics, Information and Communication Engineers
Special Section on Analog Circuit and Device Technologies -- Papers |
A Reduced-Sample-Rate Sigma-Delta-Pipeline ADC Architecture for High-Speed High-Resolution Applications
The authors are with IC Design Center, University of Tehran, Iran. E-mail: v.majidzadeh{at}ece.ut.ac.ir
A reduced-sample-rate (RSR) sigma-delta-pipeline (SDP) analog-to-digital converter architecture suitable for high-resolution and high-speed applications with low oversampling ratios (OSR) is presented. The proposed architecture employs a class of high-order noise transfer function (NTF) with a novel pole-zero locations. A design methodology is developed to reach the optimum NTF. The optimum NTF determines the location of the non-zero poles improving the stability of the loop and implementing the reduced-sample-rate structure, simultaneously. Unity gain signal transfer function to mitigate the analog circuit imperfections, simplified analog implementation with reduced number of operational transconductance amplifiers (OTAs), and novel, aggressive yet stable NTF with high out of band gain to achieve larger peak signal-to-noise ratio (SNR) are the main features of the proposed NTF and ADC architecture. To verify the usefulness of the proposed architecture, NTF, and design methodology, two different cases are investigated. Simulation results show that with a 4th-order modulator, designed making use of the proposed approach, the maximum SNDR of 115 dB and 124.1 dB can be achieved with only OSR of 8, and 16 respectively.
Key Words: sigma-delta-pipeline, reduced-sample-rate architecture, switched-capacitor circuit, IIR filters, single OTA implementation
Manuscript received November 1, 2005. Manuscript revised January 11, 2006.